Explore Our X-ray Solutions
X-9200 / X-9200L
X-9200L Semiconductor Inspection System Achieving a minimum detection accuracy of 1 µm, this system is designed for high-precision testing of integrated circuit chips and semiconductor components, including: • BGA • IGBT • Flip chips • PCBA soldering • LED bonding • IC packaging It is widely used in industries requiring ultra-fine defect detection and quality control in semiconductor manufacturing and assembly.
- X-ray Voltage: 130KV/ 90KV
- Spatial Resolution: 3μm/5μm
- Detector: 1536x1536px
- Inspection Area: 680x660mm / 620x1200mm