X-7900
Tube Voltage
130KV
Focal Spot Size
3μm
Geometric Magnification
450X
Stage Size
540x540mm
Inspection Area
510x510mm
Detector Resolution
1536x1536px
The X-7900 semiconductor X-ray inspection system can detect defects as small as 3 μm. It supports one-click measurement of void size and void ratio, with up to 400× geometric magnification and 2,500× image-system magnification.
Technical Specifications
Model
X-7900
X-ray Tube Type
Closed Tube
Focal Spot Size
3μm
Tube Voltage
130KV
Tube Current
300μA
Geometric Magnification
450X
System Magnification
2000X
Detector Resolution
1536x1536px
A/D Conversion
16bit
Frame Rate
20fps
Detector Tilt Angle
60°
Stage Size
540x540mm
Inspection Area
510x510mm
Maximum Load
≤10kg
Machine Dimensions
1098x1389x2157mm(L*W*H)
Machine Weight
1050KG
Operating System
Win11
Power Supply
AC110-220V 50-60Hz
Rated Power
1200W
Radiation Leakage
<1μSv/H